SID4 XHR Wavefront sensor
Spectral Range VIS - NIR (400 - 1100 nm)
SID4 XHR – Ultra High Resolution Wavefront Sensor. eXtremely-high resolution wavefront sensor
SID4 XHR Wavefront sensor
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Contact usTechnical Information
| Wavelength range | 400 - 1100 nm |
| Aperture dimension | 38.64 x 27.60mm² |
| Spatial resolution | 1400 x 1000 |
| Phase sampling | 27.6 µm |
| Phase resolution | 6 nm RMS |
| Dimensions | 114 x 105 x 110 mm |
| Weight | ~1kg |
Description
SID4 XHR is a large aperture, extremely high resolution wavefront sensor for advanced optics and laser metrology. It combines simple implementation with a large active area and 1400 × 1000 phase sampling, enabling live full field measurements on large optical components, expanded beams and wide field assemblies.
Optimized for surface inspection, high spatial frequency defect detection and optical component characterization, the SID4 XHR supports applications from lenses and objectives to aspherical and freeform optics.
Documentation
Industries
Smartphone
Accurate measurement of large FOV, large CRA smartphone lens in a single click
Augmented and virtual reality
High-end optical metrology tools for challenging optical systems
OEM integration
Reliable and robust wavefront sensor for a seamless integration
Optical components & assemblies
Broad range of optical testing systems