Phasics' wavefront sensors and quantitative phase imaging cameras are compact, not sensitive to vibrations, and can be integrated with any optical microscope. This makes SID4 the ideal tool to perform on-line and off-line material qualification such as mapping the change of refractive index in transparent materials, laser-induced damage threshold monitoring, optical surface topography measurements, and photothermal imaging on nanoparticles. A broad range of samples can be measured including femtosecond laser-inscribed waveguides, fiber Bragg gratings, micro-structured optical surfaces, optical coatings, nanoparticles…
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Contact usApplications in Material inspection
3D surface topography measurements
Easy to integrate surface topography measurement
Optical waveguide metrology and index of refraction mapping
Single-shot mapping of refractive index in waveguides and photonic devices
Metaoptics & metasurfaces qualification
SID4-HR: a powerful and versatile tool for the complete optical characterization of metaoptics
Nanoplasmonics and photothermal imaging
Quantitative phase microscopy applied to photothermal imaging
Laser Induced Damage Threshold (LIDT) Monitoring
On & off-line surface measurement during LIDT testing
Advantages
Insightful measurements
- Optical path differences (OPD)
- Changes of index of refraction
- Surface topography
Seamless integration
- Plug and play camera-like instrument
- Compatible with any microscope
- No need for specific objectives
Powerful capabilities
- 2D OPD maps in a single acquisition
- Sub-nanometer sensitivity
- Insensitive to vibrations