Laser & Optical Metrology

Advanced Wavefront Sensing Technologies

Exosens provides industry-leading wavefront sensing solutions powered by patented Quadriwave Lateral Shearing Interferometry (QWLSI) technology. By delivering high-resolution, achromatic measurements across an expansive spectral range—from DUV to LWIR—our wavefront metrology instruments enable the accurate qualification of complex optical components, systems, and lasers. Designed for seamless integration and robust performance in both laboratory and production environments, Exosens metrology tools streamline the alignment, characterization, and optimization of next-generation photonics-based systems.

Supporting Optics Testing, Laser Metrology, and Material Imaging

Exosens provides cutting-edge solutions for a variety of critical measurement parameters, including:

•    Transmitted Wavefront Error (TWE/WFE): High-accuracy measurements for optical system qualification.
•    Modulation Transfer Function (MTF): Comprehensive analysis of optical imaging performance.
•    Reflected Wavefront Error (RWE) & Surface Profiling: Precise characterization of surface form.
•    Laser Beam Analysis: Real-time measurement of beam wavefront aberrations, intensity profiles, and quality parameters (M2, waist size, position, etc.).
•    Refractive Index Mapping: Advanced quantitative phase imaging for material homogeneity and process validation.

Exosens solutions are utilized across the entire photonics value chain: from materials and components to system integration, alignment, and final validation:

•    Laser System Measurement & Qualification: Comprehensive laser beam characterization and system qualification to ensure peak performance.
•    Adaptive Optics & Beam Control: Real-time wavefront correction and optimization using adaptive optics and deformable mirror control.
•    Optical Component Quality Control: High-precision testing of optical components, including wavefront aberrations, surface form, RWE, and TWE.
•    System Testing and Alignment: Live, detailed analysis of Wavefront Error (WFE), Zernike polynomial decomposition, and MTF, supporting the alignment process and final qualification of lenses, objectives, and complex optical assemblies.
•    Material Inspection and Refractive Index Analysis: Advanced characterization of waveguides, thin films, and nanostructures.

These applications support both R&D environments and production processes, ensuring high performance, strict quality control, and controlled system optimization.

Designed for Versatility and Integration

Exosens develops compact, vibration-insensitive, and achromatic wavefront metrology solutions with broad wavelength compatibility from DUV to LWIR.

Our systems are designed for maximum flexibility, ranging from standalone sensors to fully integrated platforms:

•    Standalone Wavefront Sensors: High-performance SID4 wavefront sensors for flexible, plug-and-play use.
•    Modular Configurations: Adaptable setups tailored to specific needs, including KALAS for laser testing and Kaleo Kit for optics and assembly.
•    Fully Integrated & Automated Systems: Turnkey metrology solutions for production-line qualification, such as the Kaleo MTF.
•    Custom-Engineered Solutions: Bespoke systems developed to match specific customer requirements.

These capabilities allow users to adapt measurement systems to evolving requirements and diverse testing configurations.

Delivering Accuracy, Insight, and Performance

Exosens metrology solutions are designed to provide actionable insights into optical performance:

•    Accurate and repeatable characterization of optical aberrations and system performance.
•    Improved quality control in manufacturing processes.

By enabling accurate and quantitative analysis of wavefronts and optical properties, Exosens supports engineers, researchers, and manufacturers in improving system performance and advancing photonics-based systems.