SID4 eSWIR HR Wavefront sensor
Spectral Range SWIR (900 - 1700 nm) eSWIR (1.2 - 2.1 µm)
The SID4 eSWIR HR combines extended SWIR range coverage with ultra-high resolution QWLSI wavefront sensing for precision infrared laser characterization and metrology.
Extended spectral range from 1.2 to 2.2 µm
High resolution – 159 x 127 phase pixels
Compact and self-referenced for easy setup
SID4 eSWIR HR Wavefront sensor
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Contact usTechnical Information
High resolution extended SWIR wavefront sensor
| Wavelength range | 1.4 - 2.1 µm |
| Aperture dimension | 9.54 x 7.62 mm² |
| Spatial resolution | 60 µm |
| Phase and Intensity sampling | 159x127 |
| Resolution (Phase) | < 6 nm RMS* |
| Accuracy (Absolute) | < 40 nm RMS* |
| Real-time processing frequency | 10 Hz (full resolution) |
| Interface | Giga Ethernet |
| Dimensions (WxHxL) | 90 x 115 x 120 mm³ |
| Weight | ~1 kg |
*for coherent sources
Description
The SID4 eSWIR HR wavefront sensor integrates Phasics' patented technology with a T2SL detector and is the only high-resolution wavefront sensor covering the extended SWIR range from 1.2 to 2.2 µm. SID4 eSWIR is an innovative solution for testing SWIR sources and lenses used in optical communications, inspection instruments, or night vision in military and surveillance devices.
