Modulation transfer function (MTF), wavefront aberrations, surface measurement...
Phasics offers a full range of metrology tools for optics quality control, optical system alignment, and surface measurement dedicated to both production and R&D environments. Phasics' metrology instruments span from the stand-alone wavefront sensor to the automated test station. Solutions are available from UV to far IR and perform comprehensive measurements while staying easy-to-use and versatile metrology instruments. Measured parameters include: modulation transfer function (MTF) wavefront aberrations, surface form, and surface quality.
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Contact usApplications in Optics & optical systems metrology
Lens & assembly testing
Easy setup for single-shot MTF and WFE measurements
Optical system alignment
Compact and portable wavefront measurement tool
Measure optics & systems at their design wavelength
Wavefront error metrology of coated optics at their design wavelength: your wavelength is our standard!
Reliable qualification of large CRA & FOV lenses
Modulation transfer function, wavefront error, lens parameters in a single click
Filters and polarizing optics qualification
Transmitted and reflected wavefront error of filters and polarizing optics at the designed wavelength
Surface metrology
Single-shot surface qualification
Metaoptics & metasurfaces qualification
SID4-HR: a powerful and versatile tool for the complete optical characterization of metaoptics
Wavefront testing under thermal & vacuum conditions
Still the best optical metrology tool even under harsh conditions
Advantages
Flexibility of the test configuration
- Single pass or double pass
- On axis or in the field
- Any source laser, LED, black body
Single-shot complete acquisition
- Wavefront and aberrations
- MTF (any direction, through focus
- Parameters (EFL, F/#, NA, PSF)
Broad range of solutions
- UV, visible, NIR, SWIR, MWIR, LWIR
- Standalone wavefront sensors
- Fully automated test station