Tailor design and manufacturing of charged particle detectors for OEMs
El-Mul, part of Exosens is a technology leader & strategic OEM supplier of advanced charged particle detectors & devices.
Since 1992, El-Mul part of Exosens has been in the frontier of detection systems for OEM vendors in the fields of Analytic SEM and STEM, Focused Ion Beam, Mass Spectrometry and Semiconductor Metrology and Inspection e-beam tools.
Creating value for its customers through constant innovation, El-Mul is leveraging its unique experience and proprietary IP to provide comprehensive tailor-made solutions, from concept design to serial manufacturing.
Address
El-Mul Technologies
Phone
+97289422677
Opening hours
| Monday | 8AM / 6PM |
| Tuesday | 8AM / 6PM |
| Wednesday | 8AM / 6PM |
| Thursday | 8AM / 6PM |
| Friday | 8AM / 6PM |
| Saturday | Closed |
| Sunday | Closed |
WHO WE ARE
Today, Exosens Detection Israel excels in tailor-design of solutions that match our customers’ requirements. Complex detection solutions which incorporate mechanical, optical and electronic components are concieved from square one through to full development, prototyping and serial manufacturing.
Our products range from traditional detection modules to state-of-the-art systems.
Our primary asset is a team of skilled, highly educated and highly motivated professionals, representing many decades of collective expertise. An emphasis on innovation, confidentiality and personal service drives our business philosophy.
The company maintains state-of-the-art R&D, production and characterization facilities, which continue to meet and exceed our customers’ expectations.
A key strategic business goal for El-Mul is to build long-term and fruitful relationships with our customers – delivering performance, high confidence and clear value.
El-Mul part of Exosens is engaged in technologies which are complementary to its core OEM detector business. Our experience with vacuum systems, high voltage holding and electronics design can be utilized to design and manufacture different OEM sub-systems. Design of test stands for a variety of components is also offered.
We are continuously seeking to use our design and manufacturing capabilities beyond our traditional markets.
WHAT WE DO
Semiconductor E-beam Systems
Semiconductor metrology and inspection tools present unique demands for detection systems.
The requirements for increasingly higher throughput and the growing need to extract information from inner layers continuously drive El-Mul to develop novel technologies that rise up to these challenges.
El-Mul has become the world leader in fast detection technologies. Utilizing our very fast scintillator – ScintiFast™, proprietary fast low-noise amplifiers and unique methods for segmentation of the extracted signal we offer the most advanced detection solutions in this field.
Combining ScintiFast™ with a fast light sensor and specially developed electronics our detection systems can operate at 1nsec/pixel scan rate.
Mass Spectrometry
El-Mul’s detection solutions for the Mass Spectrometry industry are creating new opportunities and technology paths.
El-Mul’s patented MTOF™ technology is a platform intended for Time of Flight systems. It brings advantages in signal collection efficiency and particularly in gain stability. Using a detection chain that includes an ion-to-electron convertor, ScintiFast™ as the electron sensor and a fast, sealed light sensor, MTOF systems have a winning combination of sub-nanosecond response, wide dynamic range and by far the longest life time available for detection systems in this field.
For systems which do not require a fast response, other designs are available. Such designs, which can operate with negative ions, positive ions or both, utilize traditional scintillators and PMT to ensure detector stability over extended periods, reducing the need for re-calibration and frequent maintenance.
From traditional Everhart-Thornley detectors, through a selection of solid-state detectors and culminating with complex in-column, energy filter BSE detectors, El-Mul has a vast experience in turning proprietary and generic technologies into fit-for-purpose, engineered modules suitable for a variety of imaging applications.
El-Mul’s offering includes the design and development of novel detectors as well as built-to-print manufacturing, supporting SEM, FIB, and STEM systems. Implementing technology platforms such as segmented detection and multi-mode ion/electron detection, El-Mul delivers "tailor-made" solutions for equipment manufacturers. El-Mul also offers PMT modules which complement the detection modules, either as separate modules or integrated products.
Leveraging El-Mul’s ScintiFast™ technology, El-Mul also offers a fast detection technology platform capable of supporting scan rates up to 1nsec/pixel.
Solutions
As leader in its field, El-Mul’s integrated detection solutions demonstrate its pioneering spirit. Our turn-key systems combine novel or traditional charged particle sensors, optical modules and electronics, all selected and optimized for each of our customer’s instrument requirements.
With an increased range of proprietary scintillators, newly developed electronics modules and close collaboration with several solid state, MCP and PMT manufacturers, we consistently meet the increasing challenges of detection in state-of-the-art instrumentation.
For each instrument and application, we push technology to the edge, increasing speed, collection efficiency and SNR or reducing the footprint and cost, always raising up to our customers’ challenges.
