Discover the Future of Semiconductor Imaging at SEMICON West 2025

Join Exosens at Booth #2082, October 7–9 at the Phoenix Convention Center and explore how our Photonis and Xenics imaging technologies are advancing semiconductor and microelectronics innovation.

SWIR Microscopy – High-resolution imaging beyond the visible spectrum to detect sub-surface features, material defects, and wafer-level anomalies.

LWIR Thermography – Precise thermal mapping for identifying hotspots, process deviations, and equipment reliability issues in real time.

UV Dark Field Inspection – Enhanced defect detection by capturing scattered light from particles, scratches, and edge defects on wafers and photomasks.

Spanning UV to LWIR, our sensors, cores, and cameras deliver industrial-grade performance at competitive cost, helping fabs and equipment makers increase yield, reduce downtime, and accelerate throughput.

Learn more about our solutions: Ultraviolet, Visible & Infrared Imaging | Exosens